1 files changed, 250 insertions, 0 deletions
diff --git a/drivers/mtd/tests/stresstest.c b/drivers/mtd/tests/stresstest.c
new file mode 100644
index 00000000000..c9d42cc2df1
--- /dev/null
+++ b/drivers/mtd/tests/stresstest.c
@@ -0,0 +1,250 @@
+/*
+ * Copyright (C) 2006-2008 Nokia Corporation
+ *
+ * This program is free software; you can redistribute it and/or modify it
+ * under the terms of the GNU General Public License version 2 as published by
+ * the Free Software Foundation.
+ *
+ * This program is distributed in the hope that it will be useful, but WITHOUT
+ * ANY WARRANTY; without even the implied warranty of MERCHANTABILITY or
+ * FITNESS FOR A PARTICULAR PURPOSE. See the GNU General Public License for
+ * more details.
+ *
+ * You should have received a copy of the GNU General Public License along with
+ * this program; see the file COPYING. If not, write to the Free Software
+ * Foundation, 59 Temple Place - Suite 330, Boston, MA 02111-1307, USA.
+ *
+ * Test random reads, writes and erases on MTD device.
+ *
+ * Author: Adrian Hunter <ext-adrian.hunter@nokia.com>
+ */
+
+#define pr_fmt(fmt) KBUILD_MODNAME ": " fmt
+
+#include <linux/init.h>
+#include <linux/module.h>
+#include <linux/moduleparam.h>
+#include <linux/err.h>
+#include <linux/mtd/mtd.h>
+#include <linux/slab.h>
+#include <linux/sched.h>
+#include <linux/vmalloc.h>
+#include <linux/random.h>
+
+#include "mtd_test.h"
+
+static int dev = -EINVAL;
+module_param(dev, int, S_IRUGO);
+MODULE_PARM_DESC(dev, "MTD device number to use");
+
+static int count = 10000;
+module_param(count, int, S_IRUGO);
+MODULE_PARM_DESC(count, "Number of operations to do (default is 10000)");
+
+static struct mtd_info *mtd;
+static unsigned char *writebuf;
+static unsigned char *readbuf;
+static unsigned char *bbt;
+static int *offsets;
+
+static int pgsize;
+static int bufsize;
+static int ebcnt;
+static int pgcnt;
+
+static int rand_eb(void)
+{
+	unsigned int eb;
+
+again:
+	eb = prandom_u32();
+	/* Read or write up 2 eraseblocks at a time - hence 'ebcnt - 1' */
+	eb %= (ebcnt - 1);
+	if (bbt[eb])
+		goto again;
+	return eb;
+}
+
+static int rand_offs(void)
+{
+	unsigned int offs;
+
+	offs = prandom_u32();
+	offs %= bufsize;
+	return offs;
+}
+
+static int rand_len(int offs)
+{
+	unsigned int len;
+
+	len = prandom_u32();
+	len %= (bufsize - offs);
+	return len;
+}
+
+static int do_read(void)
+{
+	int eb = rand_eb();
+	int offs = rand_offs();
+	int len = rand_len(offs);
+	loff_t addr;
+
+	if (bbt[eb + 1]) {
+		if (offs >= mtd->erasesize)
+			offs -= mtd->erasesize;
+		if (offs + len > mtd->erasesize)
+			len = mtd->erasesize - offs;
+	}
+	addr = eb * mtd->erasesize + offs;
+	return mtdtest_read(mtd, addr, len, readbuf);
+}
+
+static int do_write(void)
+{
+	int eb = rand_eb(), offs, err, len;
+	loff_t addr;
+
+	offs = offsets[eb];
+	if (offs >= mtd->erasesize) {
+		err = mtdtest_erase_eraseblock(mtd, eb);
+		if (err)
+			return err;
+		offs = offsets[eb] = 0;
+	}
+	len = rand_len(offs);
+	len = ((len + pgsize - 1) / pgsize) * pgsize;
+	if (offs + len > mtd->erasesize) {
+		if (bbt[eb + 1])
+			len = mtd->erasesize - offs;
+		else {
+			err = mtdtest_erase_eraseblock(mtd, eb + 1);
+			if (err)
+				return err;
+			offsets[eb + 1] = 0;
+		}
+	}
+	addr = eb * mtd->erasesize + offs;
+	err = mtdtest_write(mtd, addr, len, writebuf);
+	if (unlikely(err))
+		return err;
+	offs += len;
+	while (offs > mtd->erasesize) {
+		offsets[eb++] = mtd->erasesize;
+		offs -= mtd->erasesize;
+	}
+	offsets[eb] = offs;
+	return 0;
+}
+
+static int do_operation(void)
+{
+	if (prandom_u32() & 1)
+		return do_read();
+	else
+		return do_write();
+}
+
+static int __init mtd_stresstest_init(void)
+{
+	int err;
+	int i, op;
+	uint64_t tmp;
+
+	printk(KERN_INFO "\n");
+	printk(KERN_INFO "=================================================\n");
+
+	if (dev < 0) {
+		pr_info("Please specify a valid mtd-device via module parameter\n");
+		pr_crit("CAREFUL: This test wipes all data on the specified MTD device!\n");
+		return -EINVAL;
+	}
+
+	pr_info("MTD device: %d\n", dev);
+
+	mtd = get_mtd_device(NULL, dev);
+	if (IS_ERR(mtd)) {
+		err = PTR_ERR(mtd);
+		pr_err("error: cannot get MTD device\n");
+		return err;
+	}
+
+	if (mtd->writesize == 1) {
+		pr_info("not NAND flash, assume page size is 512 "
+		       "bytes.\n");
+		pgsize = 512;
+	} else
+		pgsize = mtd->writesize;
+
+	tmp = mtd->size;
+	do_div(tmp, mtd->erasesize);
+	ebcnt = tmp;
+	pgcnt = mtd->erasesize / pgsize;
+
+	pr_info("MTD device size %llu, eraseblock size %u, "
+	       "page size %u, count of eraseblocks %u, pages per "
+	       "eraseblock %u, OOB size %u\n",
+	       (unsigned long long)mtd->size, mtd->erasesize,
+	       pgsize, ebcnt, pgcnt, mtd->oobsize);
+
+	if (ebcnt < 2) {
+		pr_err("error: need at least 2 eraseblocks\n");
+		err = -ENOSPC;
+		goto out_put_mtd;
+	}
+
+	/* Read or write up 2 eraseblocks at a time */
+	bufsize = mtd->erasesize * 2;
+
+	err = -ENOMEM;
+	readbuf = vmalloc(bufsize);
+	writebuf = vmalloc(bufsize);
+	offsets = kmalloc(ebcnt * sizeof(int), GFP_KERNEL);
+	if (!readbuf || !writebuf || !offsets)
+		goto out;
+	for (i = 0; i < ebcnt; i++)
+		offsets[i] = mtd->erasesize;
+	prandom_bytes(writebuf, bufsize);
+
+	bbt = kzalloc(ebcnt, GFP_KERNEL);
+	if (!bbt)
+		goto out;
+	err = mtdtest_scan_for_bad_eraseblocks(mtd, bbt, 0, ebcnt);
+	if (err)
+		goto out;
+
+	/* Do operations */
+	pr_info("doing operations\n");
+	for (op = 0; op < count; op++) {
+		if ((op & 1023) == 0)
+			pr_info("%d operations done\n", op);
+		err = do_operation();
+		if (err)
+			goto out;
+		cond_resched();
+	}
+	pr_info("finished, %d operations done\n", op);
+
+out:
+	kfree(offsets);
+	kfree(bbt);
+	vfree(writebuf);
+	vfree(readbuf);
+out_put_mtd:
+	put_mtd_device(mtd);
+	if (err)
+		pr_info("error %d occurred\n", err);
+	printk(KERN_INFO "=================================================\n");
+	return err;
+}
+module_init(mtd_stresstest_init);
+
+static void __exit mtd_stresstest_exit(void)
+{
+	return;
+}
+module_exit(mtd_stresstest_exit);
+
+MODULE_DESCRIPTION("Stress test module");
+MODULE_AUTHOR("Adrian Hunter");
+MODULE_LICENSE("GPL");