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-rw-r--r--Documentation/ABI/testing/sysfs-class-mtd42
1 files changed, 26 insertions, 16 deletions
diff --git a/Documentation/ABI/testing/sysfs-class-mtd b/Documentation/ABI/testing/sysfs-class-mtd
index db1ad7e34fc..1399bb2da3e 100644
--- a/Documentation/ABI/testing/sysfs-class-mtd
+++ b/Documentation/ABI/testing/sysfs-class-mtd
@@ -14,8 +14,7 @@ Description:
The /sys/class/mtd/mtd{0,1,2,3,...} directories correspond
to each /dev/mtdX character device. These may represent
physical/simulated flash devices, partitions on a flash
- device, or concatenated flash devices. They exist regardless
- of whether CONFIG_MTD_CHAR is actually enabled.
+ device, or concatenated flash devices.
What: /sys/class/mtd/mtdXro/
Date: April 2009
@@ -23,8 +22,7 @@ KernelVersion: 2.6.29
Contact: linux-mtd@lists.infradead.org
Description:
These directories provide the corresponding read-only device
- nodes for /sys/class/mtd/mtdX/ . They are only created
- (for the benefit of udev) if CONFIG_MTD_CHAR is enabled.
+ nodes for /sys/class/mtd/mtdX/ .
What: /sys/class/mtd/mtdX/dev
Date: April 2009
@@ -106,7 +104,7 @@ Description:
One of the following ASCII strings, representing the device
type:
- absent, ram, rom, nor, nand, dataflash, ubi, unknown
+ absent, ram, rom, nor, nand, mlc-nand, dataflash, ubi, unknown
What: /sys/class/mtd/mtdX/writesize
Date: April 2009
@@ -130,9 +128,8 @@ KernelVersion: 3.4
Contact: linux-mtd@lists.infradead.org
Description:
Maximum number of bit errors that the device is capable of
- correcting within each region covering an ecc step. This will
- always be a non-negative integer. Note that some devices will
- have multiple ecc steps within each writesize region.
+ correcting within each region covering an ECC step (see
+ ecc_step_size). This will always be a non-negative integer.
In the case of devices lacking any ECC capability, it is 0.
@@ -142,13 +139,14 @@ KernelVersion: 3.4
Contact: linux-mtd@lists.infradead.org
Description:
This allows the user to examine and adjust the criteria by which
- mtd returns -EUCLEAN from mtd_read(). If the maximum number of
- bit errors that were corrected on any single region comprising
- an ecc step (as reported by the driver) equals or exceeds this
- value, -EUCLEAN is returned. Otherwise, absent an error, 0 is
- returned. Higher layers (e.g., UBI) use this return code as an
- indication that an erase block may be degrading and should be
- scrutinized as a candidate for being marked as bad.
+ mtd returns -EUCLEAN from mtd_read() and mtd_read_oob(). If the
+ maximum number of bit errors that were corrected on any single
+ region comprising an ecc step (as reported by the driver) equals
+ or exceeds this value, -EUCLEAN is returned. Otherwise, absent
+ an error, 0 is returned. Higher layers (e.g., UBI) use this
+ return code as an indication that an erase block may be
+ degrading and should be scrutinized as a candidate for being
+ marked as bad.
The initial value may be specified by the flash device driver.
If not, then the default value is ecc_strength.
@@ -167,10 +165,22 @@ Description:
block degradation, but high enough to avoid the consequences of
a persistent return value of -EUCLEAN on devices where sticky
bitflips occur. Note that if bitflip_threshold exceeds
- ecc_strength, -EUCLEAN is never returned by mtd_read().
+ ecc_strength, -EUCLEAN is never returned by the read operations.
Conversely, if bitflip_threshold is zero, -EUCLEAN is always
returned, absent a hard error.
This is generally applicable only to NAND flash devices with ECC
capability. It is ignored on devices lacking ECC capability;
i.e., devices for which ecc_strength is zero.
+
+What: /sys/class/mtd/mtdX/ecc_step_size
+Date: May 2013
+KernelVersion: 3.10
+Contact: linux-mtd@lists.infradead.org
+Description:
+ The size of a single region covered by ECC, known as the ECC
+ step. Devices may have several equally sized ECC steps within
+ each writesize region.
+
+ It will always be a non-negative integer. In the case of
+ devices lacking any ECC capability, it is 0.