diff options
Diffstat (limited to 'Documentation/ABI/testing/sysfs-bus-iio')
| -rw-r--r-- | Documentation/ABI/testing/sysfs-bus-iio | 239 |
1 files changed, 190 insertions, 49 deletions
diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio index 2e33dc6b234..a9757dcf2e8 100644 --- a/Documentation/ABI/testing/sysfs-bus-iio +++ b/Documentation/ABI/testing/sysfs-bus-iio @@ -79,7 +79,7 @@ Description: correspond to externally available input one of the named versions may be used. The number must always be specified and unique to allow association with event codes. Units after - application of scale and offset are microvolts. + application of scale and offset are millivolts. What: /sys/bus/iio/devices/iio:deviceX/in_voltageY-voltageZ_raw KernelVersion: 2.6.35 @@ -90,7 +90,7 @@ Description: physically equivalent inputs when non differential readings are separately available. In differential only parts, then all that is required is a consistent labeling. Units after application - of scale and offset are microvolts. + of scale and offset are millivolts. What: /sys/bus/iio/devices/iio:deviceX/in_capacitanceY_raw KernelVersion: 3.2 @@ -114,14 +114,17 @@ What: /sys/bus/iio/devices/iio:deviceX/in_temp_raw What: /sys/bus/iio/devices/iio:deviceX/in_tempX_raw What: /sys/bus/iio/devices/iio:deviceX/in_temp_x_raw What: /sys/bus/iio/devices/iio:deviceX/in_temp_y_raw -What: /sys/bus/iio/devices/iio:deviceX/in_temp_z_raw +What: /sys/bus/iio/devices/iio:deviceX/in_temp_ambient_raw +What: /sys/bus/iio/devices/iio:deviceX/in_temp_object_raw KernelVersion: 2.6.35 Contact: linux-iio@vger.kernel.org Description: Raw (unscaled no bias removal etc.) temperature measurement. If an axis is specified it generally means that the temperature sensor is associated with one part of a compound device (e.g. - a gyroscope axis). Units after application of scale and offset + a gyroscope axis). The ambient and object modifiers distinguish + between ambient (reference) and distant temperature for contact- + less measurements. Units after application of scale and offset are milli degrees Celsius. What: /sys/bus/iio/devices/iio:deviceX/in_tempX_input @@ -197,6 +200,27 @@ Description: Raw pressure measurement from channel Y. Units after application of scale and offset are kilopascal. +What: /sys/bus/iio/devices/iio:deviceX/in_humidityrelative_raw +KernelVersion: 3.14 +Contact: linux-iio@vger.kernel.org +Description: + Raw humidity measurement of air. Units after application of + scale and offset are milli percent. + +What: /sys/bus/iio/devices/iio:deviceX/in_humidityrelative_input +KernelVersion: 3.14 +Contact: linux-iio@vger.kernel.org +Description: + Scaled humidity measurement in milli percent. + +What: /sys/bus/iio/devices/iio:deviceX/in_X_mean_raw +KernelVersion: 3.5 +Contact: linux-iio@vger.kernel.org +Description: + Averaged raw measurement from channel X. The number of values + used for averaging is device specific. The converting rules for + normal raw values also applies to the averaged raw values. + What: /sys/bus/iio/devices/iio:deviceX/in_accel_offset What: /sys/bus/iio/devices/iio:deviceX/in_accel_x_offset What: /sys/bus/iio/devices/iio:deviceX/in_accel_y_offset @@ -351,6 +375,7 @@ Description: 6kohm_to_gnd: connected to ground via a 6kOhm resistor, 20kohm_to_gnd: connected to ground via a 20kOhm resistor, 100kohm_to_gnd: connected to ground via an 100kOhm resistor, + 500kohm_to_gnd: connected to ground via a 500kOhm resistor, three_state: left floating. For a list of available output power down options read outX_powerdown_mode_available. If Y is not present the @@ -536,6 +561,62 @@ Description: value is in raw device units or in processed units (as _raw and _input do on sysfs direct channel read attributes). +What: /sys/.../events/in_accel_x_thresh_rising_hysteresis +What: /sys/.../events/in_accel_x_thresh_falling_hysteresis +What: /sys/.../events/in_accel_x_thresh_either_hysteresis +What: /sys/.../events/in_accel_y_thresh_rising_hysteresis +What: /sys/.../events/in_accel_y_thresh_falling_hysteresis +What: /sys/.../events/in_accel_y_thresh_either_hysteresis +What: /sys/.../events/in_accel_z_thresh_rising_hysteresis +What: /sys/.../events/in_accel_z_thresh_falling_hysteresis +What: /sys/.../events/in_accel_z_thresh_either_hysteresis +What: /sys/.../events/in_anglvel_x_thresh_rising_hysteresis +What: /sys/.../events/in_anglvel_x_thresh_falling_hysteresis +What: /sys/.../events/in_anglvel_x_thresh_either_hysteresis +What: /sys/.../events/in_anglvel_y_thresh_rising_hysteresis +What: /sys/.../events/in_anglvel_y_thresh_falling_hysteresis +What: /sys/.../events/in_anglvel_y_thresh_either_hysteresis +What: /sys/.../events/in_anglvel_z_thresh_rising_hysteresis +What: /sys/.../events/in_anglvel_z_thresh_falling_hysteresis +What: /sys/.../events/in_anglvel_z_thresh_either_hysteresis +What: /sys/.../events/in_magn_x_thresh_rising_hysteresis +What: /sys/.../events/in_magn_x_thresh_falling_hysteresis +What: /sys/.../events/in_magn_x_thresh_either_hysteresis +What: /sys/.../events/in_magn_y_thresh_rising_hysteresis +What: /sys/.../events/in_magn_y_thresh_falling_hysteresis +What: /sys/.../events/in_magn_y_thresh_either_hysteresis +What: /sys/.../events/in_magn_z_thresh_rising_hysteresis +What: /sys/.../events/in_magn_z_thresh_falling_hysteresis +What: /sys/.../events/in_magn_z_thresh_either_hysteresis +What: /sys/.../events/in_voltageY_thresh_rising_hysteresis +What: /sys/.../events/in_voltageY_thresh_falling_hysteresis +What: /sys/.../events/in_voltageY_thresh_either_hysteresis +What: /sys/.../events/in_tempY_thresh_rising_hysteresis +What: /sys/.../events/in_tempY_thresh_falling_hysteresis +What: /sys/.../events/in_tempY_thresh_either_hysteresis +What: /sys/.../events/in_illuminance0_thresh_falling_hysteresis +what: /sys/.../events/in_illuminance0_thresh_rising_hysteresis +what: /sys/.../events/in_illuminance0_thresh_either_hysteresis +what: /sys/.../events/in_proximity0_thresh_falling_hysteresis +what: /sys/.../events/in_proximity0_thresh_rising_hysteresis +what: /sys/.../events/in_proximity0_thresh_either_hysteresis +KernelVersion: 3.13 +Contact: linux-iio@vger.kernel.org +Description: + Specifies the hysteresis of threshold that the device is comparing + against for the events enabled by + <type>Y[_name]_thresh[_(rising|falling)]_hysteresis. + If separate attributes exist for the two directions, but + direction is not specified for this attribute, then a single + hysteresis value applies to both directions. + For falling events the hysteresis is added to the _value attribute for + this event to get the upper threshold for when the event goes back to + normal, for rising events the hysteresis is subtracted from the _value + attribute. E.g. if in_voltage0_raw_thresh_rising_value is set to 1200 + and in_voltage0_raw_thresh_rising_hysteresis is set to 50. The event + will get activated once in_voltage0_raw goes above 1200 and will become + deactived again once the value falls below 1150. + What: /sys/.../events/in_accel_x_raw_roc_rising_value What: /sys/.../events/in_accel_x_raw_roc_falling_value What: /sys/.../events/in_accel_y_raw_roc_rising_value @@ -690,45 +771,47 @@ Description: Actually start the buffer capture up. Will start trigger if first device and appropriate. -What: /sys/bus/iio/devices/iio:deviceX/buffer/scan_elements +What: /sys/bus/iio/devices/iio:deviceX/scan_elements KernelVersion: 2.6.37 Contact: linux-iio@vger.kernel.org Description: Directory containing interfaces for elements that will be captured for a single triggered sample set in the buffer. -What: /sys/.../buffer/scan_elements/in_accel_x_en -What: /sys/.../buffer/scan_elements/in_accel_y_en -What: /sys/.../buffer/scan_elements/in_accel_z_en -What: /sys/.../buffer/scan_elements/in_anglvel_x_en -What: /sys/.../buffer/scan_elements/in_anglvel_y_en -What: /sys/.../buffer/scan_elements/in_anglvel_z_en -What: /sys/.../buffer/scan_elements/in_magn_x_en -What: /sys/.../buffer/scan_elements/in_magn_y_en -What: /sys/.../buffer/scan_elements/in_magn_z_en -What: /sys/.../buffer/scan_elements/in_timestamp_en -What: /sys/.../buffer/scan_elements/in_voltageY_supply_en -What: /sys/.../buffer/scan_elements/in_voltageY_en -What: /sys/.../buffer/scan_elements/in_voltageY-voltageZ_en -What: /sys/.../buffer/scan_elements/in_incli_x_en -What: /sys/.../buffer/scan_elements/in_incli_y_en -What: /sys/.../buffer/scan_elements/in_pressureY_en -What: /sys/.../buffer/scan_elements/in_pressure_en +What: /sys/.../iio:deviceX/scan_elements/in_accel_x_en +What: /sys/.../iio:deviceX/scan_elements/in_accel_y_en +What: /sys/.../iio:deviceX/scan_elements/in_accel_z_en +What: /sys/.../iio:deviceX/scan_elements/in_anglvel_x_en +What: /sys/.../iio:deviceX/scan_elements/in_anglvel_y_en +What: /sys/.../iio:deviceX/scan_elements/in_anglvel_z_en +What: /sys/.../iio:deviceX/scan_elements/in_magn_x_en +What: /sys/.../iio:deviceX/scan_elements/in_magn_y_en +What: /sys/.../iio:deviceX/scan_elements/in_magn_z_en +What: /sys/.../iio:deviceX/scan_elements/in_timestamp_en +What: /sys/.../iio:deviceX/scan_elements/in_voltageY_supply_en +What: /sys/.../iio:deviceX/scan_elements/in_voltageY_en +What: /sys/.../iio:deviceX/scan_elements/in_voltageY-voltageZ_en +What: /sys/.../iio:deviceX/scan_elements/in_incli_x_en +What: /sys/.../iio:deviceX/scan_elements/in_incli_y_en +What: /sys/.../iio:deviceX/scan_elements/in_pressureY_en +What: /sys/.../iio:deviceX/scan_elements/in_pressure_en +What: /sys/.../iio:deviceX/scan_elements/in_rot_quaternion_en KernelVersion: 2.6.37 Contact: linux-iio@vger.kernel.org Description: Scan element control for triggered data capture. -What: /sys/.../buffer/scan_elements/in_accel_type -What: /sys/.../buffer/scan_elements/in_anglvel_type -What: /sys/.../buffer/scan_elements/in_magn_type -What: /sys/.../buffer/scan_elements/in_incli_type -What: /sys/.../buffer/scan_elements/in_voltageY_type -What: /sys/.../buffer/scan_elements/in_voltage_type -What: /sys/.../buffer/scan_elements/in_voltageY_supply_type -What: /sys/.../buffer/scan_elements/in_timestamp_type -What: /sys/.../buffer/scan_elements/in_pressureY_type -What: /sys/.../buffer/scan_elements/in_pressure_type +What: /sys/.../iio:deviceX/scan_elements/in_accel_type +What: /sys/.../iio:deviceX/scan_elements/in_anglvel_type +What: /sys/.../iio:deviceX/scan_elements/in_magn_type +What: /sys/.../iio:deviceX/scan_elements/in_incli_type +What: /sys/.../iio:deviceX/scan_elements/in_voltageY_type +What: /sys/.../iio:deviceX/scan_elements/in_voltage_type +What: /sys/.../iio:deviceX/scan_elements/in_voltageY_supply_type +What: /sys/.../iio:deviceX/scan_elements/in_timestamp_type +What: /sys/.../iio:deviceX/scan_elements/in_pressureY_type +What: /sys/.../iio:deviceX/scan_elements/in_pressure_type +What: /sys/.../iio:deviceX/scan_elements/in_rot_quaternion_type KernelVersion: 2.6.37 Contact: linux-iio@vger.kernel.org Description: @@ -752,29 +835,30 @@ Description: For other storage combinations this attribute will be extended appropriately. -What: /sys/.../buffer/scan_elements/in_accel_type_available +What: /sys/.../iio:deviceX/scan_elements/in_accel_type_available KernelVersion: 2.6.37 Contact: linux-iio@vger.kernel.org Description: If the type parameter can take one of a small set of values, this attribute lists them. -What: /sys/.../buffer/scan_elements/in_voltageY_index -What: /sys/.../buffer/scan_elements/in_voltageY_supply_index -What: /sys/.../buffer/scan_elements/in_accel_x_index -What: /sys/.../buffer/scan_elements/in_accel_y_index -What: /sys/.../buffer/scan_elements/in_accel_z_index -What: /sys/.../buffer/scan_elements/in_anglvel_x_index -What: /sys/.../buffer/scan_elements/in_anglvel_y_index -What: /sys/.../buffer/scan_elements/in_anglvel_z_index -What: /sys/.../buffer/scan_elements/in_magn_x_index -What: /sys/.../buffer/scan_elements/in_magn_y_index -What: /sys/.../buffer/scan_elements/in_magn_z_index -What: /sys/.../buffer/scan_elements/in_incli_x_index -What: /sys/.../buffer/scan_elements/in_incli_y_index -What: /sys/.../buffer/scan_elements/in_timestamp_index -What: /sys/.../buffer/scan_elements/in_pressureY_index -What: /sys/.../buffer/scan_elements/in_pressure_index +What: /sys/.../iio:deviceX/scan_elements/in_voltageY_index +What: /sys/.../iio:deviceX/scan_elements/in_voltageY_supply_index +What: /sys/.../iio:deviceX/scan_elements/in_accel_x_index +What: /sys/.../iio:deviceX/scan_elements/in_accel_y_index +What: /sys/.../iio:deviceX/scan_elements/in_accel_z_index +What: /sys/.../iio:deviceX/scan_elements/in_anglvel_x_index +What: /sys/.../iio:deviceX/scan_elements/in_anglvel_y_index +What: /sys/.../iio:deviceX/scan_elements/in_anglvel_z_index +What: /sys/.../iio:deviceX/scan_elements/in_magn_x_index +What: /sys/.../iio:deviceX/scan_elements/in_magn_y_index +What: /sys/.../iio:deviceX/scan_elements/in_magn_z_index +What: /sys/.../iio:deviceX/scan_elements/in_incli_x_index +What: /sys/.../iio:deviceX/scan_elements/in_incli_y_index +What: /sys/.../iio:deviceX/scan_elements/in_timestamp_index +What: /sys/.../iio:deviceX/scan_elements/in_pressureY_index +What: /sys/.../iio:deviceX/scan_elements/in_pressure_index +What: /sys/.../iio:deviceX/scan_elements/in_rot_quaternion_index KernelVersion: 2.6.37 Contact: linux-iio@vger.kernel.org Description: @@ -792,3 +876,60 @@ Contact: linux-iio@vger.kernel.org Description: This attribute is used to read the amount of quadrature error present in the device at a given time. + +What: /sys/.../iio:deviceX/in_accelX_power_mode +KernelVersion: 3.11 +Contact: linux-iio@vger.kernel.org +Description: + Specifies the chip power mode. + low_noise: reduce noise level from ADC, + low_power: enable low current consumption. + For a list of available output power modes read + in_accel_power_mode_available. + +What: /sys/bus/iio/devices/iio:deviceX/store_eeprom +KernelVersion: 3.4.0 +Contact: linux-iio@vger.kernel.org +Description: + Writing '1' stores the current device configuration into + on-chip EEPROM. After power-up or chip reset the device will + automatically load the saved configuration. + +What: /sys/.../iio:deviceX/in_illuminanceY_input +What: /sys/.../iio:deviceX/in_illuminanceY_raw +What: /sys/.../iio:deviceX/in_illuminanceY_mean_raw +KernelVersion: 3.4 +Contact: linux-iio@vger.kernel.org +Description: + Illuminance measurement, units after application of scale + and offset are lux. + +What: /sys/.../iio:deviceX/in_intensityY_raw +What: /sys/.../iio:deviceX/in_intensityY_ir_raw +What: /sys/.../iio:deviceX/in_intensityY_both_raw +KernelVersion: 3.4 +Contact: linux-iio@vger.kernel.org +Description: + Unit-less light intensity. Modifiers both and ir indicate + that measurements contains visible and infrared light + components or just infrared light, respectively. + +What: /sys/.../iio:deviceX/in_intensity_red_integration_time +What: /sys/.../iio:deviceX/in_intensity_green_integration_time +What: /sys/.../iio:deviceX/in_intensity_blue_integration_time +What: /sys/.../iio:deviceX/in_intensity_clear_integration_time +What: /sys/.../iio:deviceX/in_illuminance_integration_time +KernelVersion: 3.12 +Contact: linux-iio@vger.kernel.org +Description: + This attribute is used to get/set the integration time in + seconds. + +What: /sys/bus/iio/devices/iio:deviceX/in_rot_quaternion_raw +KernelVersion: 3.15 +Contact: linux-iio@vger.kernel.org +Description: + Raw value of quaternion components using a format + x y z w. Here x, y, and z component represents the axis about + which a rotation will occur and w component represents the + amount of rotation. |