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| author | Tomas Vanek <vanekt@fbl.cz> | 2017-07-13 21:35:22 +0200 |
|---|---|---|
| committer | Paul Fertser <fercerpav@gmail.com> | 2017-07-24 13:11:06 +0100 |
| commit | 02bc718d1a49dd04bffa446f1dadd6b86d0d107c (patch) | |
| tree | c8f9d00bad312b3563c05733086dc891929640df /src/flash/nor/stm32lx.c | |
| parent | dbd0d90af9ba12934eabd68d82aac9d7eb7e1e6a (diff) | |
flash Kinetis: fix probe for FlexNVM partitioned as EEPROM backup
If a MCU has FlexNVM partitioned as EEPROM backup only
(no data flash), kinetis_probe_chip() detects zero fcfg2_maxaddr1
and adjusts flash banks count to 1, what is obviously wrong.
The change limits the test to devices without FlexNVM.
Computation of program flash/FlexNVM blocks is now more robust.
Missing case 0x07 is added to switch (fcfg1_depart)
Change-Id: I0bd6030a0fe1ab62aeb0223bbdf2aee1505bf6a0
Reported-by: simon.haines@scalardata.com
Signed-off-by: Tomas Vanek <vanekt@fbl.cz>
Reviewed-on: http://openocd.zylin.com/4180
Tested-by: jenkins
Reviewed-by: Simon Haines <simon.haines@scalardata.com>
Reviewed-by: Paul Fertser <fercerpav@gmail.com>
Diffstat (limited to 'src/flash/nor/stm32lx.c')
0 files changed, 0 insertions, 0 deletions