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The mtd_pagetest test did not initialize the pgsize variable, which
basically means it did not work. This problem was reported by
Török Edwin <edwintorok@gmail.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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This module tests NAND ECC functions.
The test is simple.
1. Create a 256 or 512 bytes block of data filled with random bytes (data)
2. Duplicate the data block and inject single bit error (error_data)
3. Try to correct error_data
4. Compare data and error_data
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Acked-by: Vimal Singh <vimalsingh@ti.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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- Remove unnecessary memset for bbt
All entries will be initialized at a few lines below
- Remove unnecessary initialization for mtd->erasesize
- Use write_whole_device()
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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Check whether index is within bounds before testing the element.
Signed-off-by: Roel Kluin <roel.kluin@gmail.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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Fix this sparse warnings:
drivers/mtd/tests/mtd_oobtest.c:139:33: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:192:33: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:219:41: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:284:25: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:525:25: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:545:25: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:569:33: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:589:33: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:613:33: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:633:33: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:673:41: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:701:33: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_readtest.c:74:41: warning: Using plain integer as NULL pointer
Signed-off-by: Hannes Eder <hannes@hanneseder.net>
Acked-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: Jiri Kosina <jkosina@suse.cz>
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Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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Add MTD tests to Kconfig and Makefiles.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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This test is designed to work for very long time and it tries to
wear few eraseblocks.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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This tests makes sure sub-pages on NAND MTD device work fine.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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This test just performs random operations on random eraseblocks.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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This test examines I/O speed of the flash device.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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A simple tests which reads whole MTD device one page at a time.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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This test checks that NAND pages read/write work fine.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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This test checks that OOB of a NAND MTD device works fine.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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