diff options
| author | Linus Torvalds <torvalds@linux-foundation.org> | 2013-09-09 10:33:19 -0700 |
|---|---|---|
| committer | Linus Torvalds <torvalds@linux-foundation.org> | 2013-09-09 10:33:19 -0700 |
| commit | ef9a61bef917e38f8e096f6df303329aed6cf467 (patch) | |
| tree | 31cfe2444d0270e77ff8ef792df11591fed6075c /Documentation/ABI | |
| parent | b5f0998cae3d7ea56d3d8377e46328fe972b9546 (diff) | |
| parent | 6c3b88970175e18a67eb8e55c4eba10614d0d5dc (diff) | |
Merge tag 'for-linus-20130909' of git://git.infradead.org/linux-mtd
Pull mtd updates from David Woodhouse:
- factor out common code from MTD tests
- nand-gpio cleanup and portability to non-ARM
- m25p80 support for 4-byte addressing chips, other new chips
- pxa3xx cleanup and support for new platforms
- remove obsolete alauda, octagon-5066 drivers
- erase/write support for bcm47xxsflash
- improve detection of ECC requirements for NAND, controller setup
- NFC acceleration support for atmel-nand, read/write via SRAM
- etc
* tag 'for-linus-20130909' of git://git.infradead.org/linux-mtd: (184 commits)
mtd: chips: Add support for PMC SPI Flash chips in m25p80.c
mtd: ofpart: use for_each_child_of_node() macro
mtd: mtdswap: replace strict_strtoul() with kstrtoul()
mtd cs553x_nand: use kzalloc() instead of memset
mtd: atmel_nand: fix error return code in atmel_nand_probe()
mtd: bcm47xxsflash: writing support
mtd: bcm47xxsflash: implement erasing support
mtd: bcm47xxsflash: convert to module_platform_driver instead of init/exit
mtd: bcm47xxsflash: convert kzalloc to avoid invalid access
mtd: remove alauda driver
mtd: nand: mxc_nand: mark 'const' properly
mtd: maps: cfi_flagadm: add missing __iomem annotation
mtd: spear_smi: add missing __iomem annotation
mtd: r852: Staticize local symbols
mtd: nandsim: Staticize local symbols
mtd: impa7: add missing __iomem annotation
mtd: sm_ftl: Staticize local symbols
mtd: m25p80: add support for mr25h10
mtd: m25p80: make CONFIG_M25PXX_USE_FAST_READ safe to enable
mtd: m25p80: Pass flags through CAT25_INFO macro
...
Diffstat (limited to 'Documentation/ABI')
| -rw-r--r-- | Documentation/ABI/testing/sysfs-class-mtd | 17 |
1 files changed, 14 insertions, 3 deletions
diff --git a/Documentation/ABI/testing/sysfs-class-mtd b/Documentation/ABI/testing/sysfs-class-mtd index 3105644b3bf..bfd119ace6a 100644 --- a/Documentation/ABI/testing/sysfs-class-mtd +++ b/Documentation/ABI/testing/sysfs-class-mtd @@ -128,9 +128,8 @@ KernelVersion: 3.4 Contact: linux-mtd@lists.infradead.org Description: Maximum number of bit errors that the device is capable of - correcting within each region covering an ecc step. This will - always be a non-negative integer. Note that some devices will - have multiple ecc steps within each writesize region. + correcting within each region covering an ECC step (see + ecc_step_size). This will always be a non-negative integer. In the case of devices lacking any ECC capability, it is 0. @@ -173,3 +172,15 @@ Description: This is generally applicable only to NAND flash devices with ECC capability. It is ignored on devices lacking ECC capability; i.e., devices for which ecc_strength is zero. + +What: /sys/class/mtd/mtdX/ecc_step_size +Date: May 2013 +KernelVersion: 3.10 +Contact: linux-mtd@lists.infradead.org +Description: + The size of a single region covered by ECC, known as the ECC + step. Devices may have several equally sized ECC steps within + each writesize region. + + It will always be a non-negative integer. In the case of + devices lacking any ECC capability, it is 0. |